AML100 ATE Production Tester (2021-2023)

Background

I designed all the electronics for Aspinity’s AML100 ATE Production Tester. The ATE hardware is comprised of 4 channels, each used for simultaneous characterization and production testing of Aspinity’s AML100 ultra low power analog sensing IC. The hardware utilizes one main motherboard with 4 separate IC test sites (for parallel testing). Each test site employs high density, high-mating cycle, rugged connector used for connecting a test daughterboard. Each daughterboard is driven by a STM32H27 MCU and contains circuitry used for forcing current, forcing voltage, sensing current, and sensing voltage as well as circuits for telemetry. The ATE is installed in an Epson Seiko NS6040 IC handler at a test house in Milpitas, CA.

Additionally, I designed the adapter mounting plate for mechanical interface between handler/ATE motherboard, designed and 3D printed cable strain relief handles for the daughterboard and wrote software (bringup firmware for the MCU and python test scripts for interfacing with the platform)